Effects of high temperature annealing on single crystal ZnO and ZnO devices

dc.contributor.author	Mtangi, Wilfred
dc.contributor.author	Auriet, F.D.
dc.contributor.author	Diale, M.
dc.contributor.author	Chawanda, Albert
dc.contributor.author	Meyer, de H
dc.contributor.author	Rensburg, P.J Janse
dc.contributor.author	Nel, J. M.
dc.date.accessioned	2014-09-01T10:13:53Z
dc.date.available	2014-09-01T10:13:53Z
dc.date.issued	2012
dc.identifier.uri	http://hdl.handle.net/11408/418
dc.language.iso	en	en_US
dc.publisher	American Institute of Physics	en_US
dc.relation.ispartofseries	Journal of Applied Physics; Vol.3
dc.subject	High temperature annealing	en_US
dc.title	Effects of high temperature annealing on single crystal ZnO and ZnO devices	en_US
dc.type	Article	en_US