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Effects of high temperature annealing on single crystal ZnO and ZnO devices

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dc.contributor.author Mtangi, Wilfred
dc.contributor.author Auriet, F.D.
dc.contributor.author Diale, M.
dc.contributor.author Chawanda, Albert
dc.contributor.author Meyer, de H
dc.contributor.author Rensburg, P.J Janse
dc.contributor.author Nel, J. M.
dc.date.accessioned 2014-09-01T10:13:53Z
dc.date.available 2014-09-01T10:13:53Z
dc.date.issued 2012
dc.identifier.uri http://hdl.handle.net/11408/418
dc.language.iso en en_US
dc.publisher American Institute of Physics en_US
dc.relation.ispartofseries Journal of Applied Physics; Vol.3
dc.subject High temperature annealing en_US
dc.title Effects of high temperature annealing on single crystal ZnO and ZnO devices en_US
dc.type Article en_US


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